[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Analysis of temporal masking effect on single-event upset rates for sequential circuits
Chen, R. M., Diggins, Z. J., Mahatme, N. N., Wang, L., Zhang, E. X., Chen, Y. P., Liu, Y. N., Narasimham, B., Witulski, A. F., Bhuva, B. L.Year:
2016
Language:
english
DOI:
10.1109/radecs.2016.8093177
File:
PDF, 1.16 MB
english, 2016