The simulation of thermal characteristics of 980 nm...

Journal of Semiconductors 2018 / 02 Vol. 39; Iss. 2

The simulation of thermal characteristics of 980 nm vertical cavity surface emitting lasers

Fang, Tianxiao, Cui, Bifeng, Hao, Shuai, Wang, Yang
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Volume:
39
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/39/2/024001
Date:
February, 2018
File:
PDF, 1.11 MB
english, 2018
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