[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - Testing of Interconnect Defects in Memory Based Reconfigurable Logic Device (MRLD)
Wang, Senling, Higami, Yoshinobu, Takahashi, Hiroshi, Sato, Masayuki, Katsu, Mitsunori, Sekiguchi, ShoichiYear:
2017
DOI:
10.1109/ATS.2017.16
File:
PDF, 1.32 MB
2017