[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - Intra-Die-Variation-Aware Side Channel Analysis for Hardware Trojan Detection
Hossain, Fakir Sharif, Yoneda, Tomokazu, Shintani, Michihiro, Inoue, Michiko, Orailoglo, AlexYear:
2017
Language:
english
DOI:
10.1109/ATS.2017.22
File:
PDF, 473 KB
english, 2017