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[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - On Securing Scan Design from Scan-Based Side-Channel Attacks
Ahlawat, Satyadev, Vaghani, Darshit, Tudu, Jaynarayan, Singh, VirendraYear:
2017
Language:
english
DOI:
10.1109/ATS.2017.23
File:
PDF, 359 KB
english, 2017