![](/img/cover-not-exists.png)
[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study
Andjelkovic, Marko, Krstic, Milos, Kraemer, Rolf, Veeravalli, Varadan Savulimedu, Steininger, AndreasYear:
2017
Language:
english
DOI:
10.1109/ATS.2017.27
File:
PDF, 397 KB
english, 2017