[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - SAR TDC Architecture with Self-Calibration Employing Trigger Circuit
Ozawa, Yuki, Ida, Takashi, Jiang, Richen, Sakurai, Shotaro, Takigami, Seiya, Tsukiji, Nobukazu, Shiota, Ryoji, Kobayashi, HaruoYear:
2017
Language:
english
DOI:
10.1109/ATS.2017.29
File:
PDF, 2.76 MB
english, 2017