[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections
Koga, Keitaro, Awano, Hiromitsu, Ikeda, MakotoYear:
2017
Language:
english
DOI:
10.1109/ATS.2017.46
File:
PDF, 1.10 MB
english, 2017