![](/img/cover-not-exists.png)
[IEEE 2017 IEEE 35th International Conference on Computer Design (ICCD) - Boston, MA (2017.11.5-2017.11.8)] 2017 IEEE International Conference on Computer Design (ICCD) - Exploiting Process Variation for Read Performance Improvement on LDPC Based Flash Memory Storage Systems
Li, Qiao, Shi, Liang, Di, Yejia, Du, Yajuan, Xue, Chun J., Sha, Edwin H.M.Year:
2017
Language:
english
DOI:
10.1109/ICCD.2017.118
File:
PDF, 168 KB
english, 2017