[IEEE 2017 IEEE 35th International Conference on Computer Design (ICCD) - Boston, MA (2017.11.5-2017.11.8)] 2017 IEEE International Conference on Computer Design (ICCD) - ILP-Based Identification of Redundant Logic Insertions for Opportunistic Yield Improvement during Early Process Learning
Chan, Tuck-Boon, Chan, Wei-Ting Jonas, Kahng, Andrew B.Year:
2017
Language:
english
DOI:
10.1109/ICCD.2017.48
File:
PDF, 209 KB
english, 2017