An NMOS Static ESD Power Supply Clamp with Thyristor Delay Element and 180 pA Leakage in 65 nm CMOS Technology
Elghazali, Mahdi, Sachdev, Manoj, Opal, AjoyYear:
2018
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2018.2802378
File:
PDF, 1.03 MB
english, 2018