Damage Factor for Radiation-Induced Dark Current in InGaAs Photodiodes
Gilard, Olivier, How, Lip Sun, Delbergue, Audrey, Inguimbert, Christophe, Nuns, Thierry, Barbero, Juan, Moreno, Juan, Bouet, Louis, Mariojouls, Stephane, Boutillier, MathieuYear:
2018
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2018.2799742
File:
PDF, 309 KB
english, 2018