Stress-Induced Resistive Switching in Pt/HfO2/Ti Devices
Zeevi, Gilad, Katsman, Alexander, Yaish, Yuval E.Volume:
47
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-017-5919-5
Date:
February, 2018
File:
PDF, 1.32 MB
english, 2018