High Resolution Imaging of Short-Range Order Materials (Allophane) with Aberration Corrected TEM and Direct Electron Detection
Sharp, Thomas G., Chang, Shery L.Y.Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617011424
Date:
July, 2017
File:
PDF, 2.67 MB
english, 2017