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[IEEE 2017 32nd IEEE/ACM International Conference on Automated Software Engineering (ASE) - Urbana, IL (2017.10.30-2017.11.3)] 2017 32nd IEEE/ACM International Conference on Automated Software Engineering (ASE) - Towards robust instruction-level trace alignment of binary code
Kargen, Ulf, Shahmehri, NahidYear:
2017
Language:
english
DOI:
10.1109/ASE.2017.8115647
File:
PDF, 401 KB
english, 2017