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[IEEE 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) - Fort Worth, TX, USA (2017.10.22-2017.10.25)] 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) - Electrical treeing characteristics near multi-layer interface
Abe, Shinnosuke, Kawashima, Tomohiro, Nagao, Masayuki, Hozumi, Naohiro, Murakami, Yoshinobu, Miyakawa, Naruto, Shiota, Hiroki, Tsurimoto, TakaoYear:
2017
Language:
english
DOI:
10.1109/CEIDP.2017.8257487
File:
PDF, 454 KB
english, 2017