[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Power-Performance Trade-Offs in Nanometer-Scale Multi-Level Caches Considering Total Leakage
Bai, R., Nam-Sung Kim,, Tae Ho Kgil,, Sylvester, D., Mudge, T.Year:
2005
Language:
english
DOI:
10.1109/DATE.2005.243
File:
PDF, 102 KB
english, 2005