![](/img/cover-not-exists.png)
[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - Challenges and opportunities toward online training acceleration using RRAM-based hardware neural network
Chang, Chih-Cheng, Liu, Jen-Chieh, Shen, Yu-Lin, Chou, Teyuh, Chen, Pin-Chun, Wang, I.-Ting, Su, Chih-Chun, Wu, Ming-Hong, Hudec, Boris, Chang, Che-Chia, Tsai, Chia-Ming, Chang, Tian-Sheuan, Wong, H.-Year:
2017
DOI:
10.1109/IEDM.2017.8268373
File:
PDF, 1.31 MB
2017