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Comparing the Gate Dependence of Contact Resistance and Channel Resistance in Organic Field-effect Transistors for Understanding the Mobility Overestimation Issue
Hu, Yuanyuan, Li, Guodong, Peng, Wei, Chen, ZhuojunYear:
2018
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2798288
File:
PDF, 444 KB
english, 2018