Origin of Electrical Instabilities in Self-Aligned...

IEEE Transactions on Electron Devices 2017 / 12 Vol. 64; Iss. 12

Origin of Electrical Instabilities in Self-Aligned Amorphous In–Ga–Zn–O Thin-Film Transistors

On, Nuri, Kang, Youngho, Song, Aeran, Ahn, Byung Du, Kim, Hye Dong, Lim, Jun Hyung, Chung, Kwun-Bum, Han, Seungwu, Jeong, Jae Kyeong
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2766148
Date:
December, 2017
File:
PDF, 1.19 MB
english, 2017
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