[IEEE 2017 4th IEEE Uttar Pradesh Section International Conference on Electrical, Computer and Electronics (UPCON) - Mathura (2017.10.26-2017.10.28)] 2017 4th IEEE Uttar Pradesh Section International Conference on Electrical, Computer and Electronics (UPCON) - NO-SHAM: An effective tool based on a novel hybrid approach to detect copy-move forgery in images
Singh, Lal Upendra Pratap, Agrawal, AnupamYear:
2017
Language:
english
DOI:
10.1109/UPCON.2017.8251081
File:
PDF, 738 KB
english, 2017