Depth Profile of Impurity Phase in Wide-Bandgap...

  • Main
  • 2018 / 2
  • Depth Profile of Impurity Phase in Wide-Bandgap...
Journal of Electronic Materials 2018 / 2

Depth Profile of Impurity Phase in Wide-Bandgap Cu(In1−x,Gax)Se2 Film Fabricated by Three-Stage Process

Wang, Shenghao, Nazuka, Takehiro, Hagiya, Hideki, Takabayashi, Yutaro, Ishizuka, Shogo, Shibata, Hajime, Niki, Shigeru, Islam, Muhammad M., Akimoto, Katsuhiro, Sakurai, Takeaki
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-018-6120-1
Date:
February, 2018
File:
PDF, 1.03 MB
english, 2018
Conversion to is in progress
Conversion to is failed