[IEEE 2017 2nd International Conference on System Reliability and Safety (ICSRS) - Milan, Italy (2017.12.20-2017.12.22)] 2017 2nd International Conference on System Reliability and Safety (ICSRS) - Accelerated-compensated degradation modeling based on synthesized-stress enhancement test data
Yang, Nina, Feng, Jing, Liu, Tianyu, Pan, Zhengqiang, Meng, JieruYear:
2017
Language:
english
DOI:
10.1109/ICSRS.2017.8272832
File:
PDF, 351 KB
english, 2017