[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - Femto-joule-per-bit integrated nanophotonics and challenge for optical computation
Notomi, Masaya, Nozaki, Kengo, Shinya, Akihiko, Takiguchi, MasatoYear:
2017
Language:
english
DOI:
10.1109/IEDM.2017.8268497
File:
PDF, 267 KB
english, 2017