[IEEE 2017 IEEE 15th International Conference on Industrial...

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[IEEE 2017 IEEE 15th International Conference on Industrial Informatics (INDIN) - Emden (2017.7.24-2017.7.26)] 2017 IEEE 15th International Conference on Industrial Informatics (INDIN) - Grid-based outlier detection in large data sets for combine harvesters

Gu, Ying, Ganesan, Ram Kumar, Bischke, Benjamin, Bernardi, Ansgar, Maier, Alexander, Warkentin, Heinrich, Steckel, Thilo, Dengel, Andreas
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Year:
2017
Language:
english
DOI:
10.1109/INDIN.2017.8104877
File:
PDF, 1.13 MB
english, 2017
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