Charge-Based Modeling of Radiation Damage in Symmetric...

IEEE Journal of the Electron Devices Society 2018 / 12 Vol. 6; Iss. 1

Charge-Based Modeling of Radiation Damage in Symmetric Double-Gate MOSFETs

Jazaeri, Farzan, Zhang, Chun-Min, Pezzotta, Alessandro, Enz, Christian
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Volume:
6
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2017.2772346
Date:
December, 2018
File:
PDF, 1.38 MB
english, 2018
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