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Interfacial Defects: Probing and Manipulating the Interfacial Defects of InGaAs Dual-Layer Metal Oxides at the Atomic Scale (Adv. Mater. 2/2018)
Wu, Xing, Luo, Chen, Hao, Peng, Sun, Tao, Wang, Runsheng, Wang, Chaolun, Hu, Zhigao, Li, Yawei, Zhang, Jian, Bersuker, Gennadi, Sun, Litao, Pey, KinleongVolume:
30
Journal:
Advanced Materials
DOI:
10.1002/adma.201870013
Date:
January, 2018
File:
PDF, 9.30 MB
2018