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[IEEE 2017 IEEE 15th International Conference on Industrial Informatics (INDIN) - Emden (2017.7.24-2017.7.26)] 2017 IEEE 15th International Conference on Industrial Informatics (INDIN) - Complexity based test cases for log file analyzers
Heikkinen, Esa, Hamalainen, Timo D.Year:
2017
Language:
english
DOI:
10.1109/INDIN.2017.8104911
File:
PDF, 301 KB
english, 2017