[IEEE 2016 20th International Symposium on VLSI Design and...

  • Main
  • [IEEE 2016 20th International Symposium...

[IEEE 2016 20th International Symposium on VLSI Design and Test (VDAT) - Guwahati, India (2016.5.24-2016.5.27)] 2016 20th International Symposium on VLSI Design and Test (VDAT) - An efficient reversible cryptographic circuit design

Mondal, Bikromadittya, Dey, Kushal, Chakraborty, Susanta
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2016
Language:
english
DOI:
10.1109/ISVDAT.2016.8064874
File:
PDF, 1.53 MB
english, 2016
Conversion to is in progress
Conversion to is failed