[IEEE 2017 32nd Symposium on Microelectronics Technology...

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[IEEE 2017 32nd Symposium on Microelectronics Technology and Devices (SBMicro) - Fortaleza (2017.8.28-2017.9.1)] 2017 32nd Symposium on Microelectronics Technology and Devices (SBMicro) - Back gate influence on transistor efficiency of SOI nMOS Ω-gate nanowire down to 10nm width

Itocazu, Vitor T., Almeida, Luciano M., Sonnenberg, Victor, Agopian, Paula G. D., Barraud, Sylvain, Vinet, Maud, Faynot, Olivier, Martino, Joao A.
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Year:
2017
Language:
english
DOI:
10.1109/SBMicro.2017.8113021
File:
PDF, 318 KB
english, 2017
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