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[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - Concurrent built in test and tuning of beamforming MIMO systems using learning assisted performance optimization
Deyati, Sabyasachi, Muldrey, Barry J., Jung, Byunghoo, Chatterjee, AbhijitYear:
2017
Language:
english
DOI:
10.1109/TEST.2017.8242031
File:
PDF, 897 KB
english, 2017