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[IEEE ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC) - Leuven, Belgium (2017.9.11-2017.9.14)] 2017 47th European Solid-State Device Research Conference (ESSDERC) - Study of strained effects in nanoscale GAA nanowire FETs using 3D Monte Carlo simulations
Elmessary, Muhammad A., Nagy, Daniel, Aldegunde, Manuel, Garcia-Loureiro, Antonio J., Kalna, KarolYear:
2017
Language:
english
DOI:
10.1109/essderc.2017.8066622
File:
PDF, 2.41 MB
english, 2017