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Alpha particle spectroscopy using FNTD and SIM super-resolution microscopy
KOUWENBERG, J.J.M., KREMERS, G.J., SLOTMAN, J.A., WOLTERBEEK, H.T., HOUTSMULLER, A.B., DENKOVA, A.G., BOS, A.J.J.Language:
english
Journal:
Journal of Microscopy
DOI:
10.1111/jmi.12686
Date:
February, 2018
File:
PDF, 954 KB
english, 2018