[IEEE 2017 International Conference on Simulation of...

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[IEEE 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Kamakura, Japan (2017.9.7-2017.9.9)] 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - An accurate metric to control time step of transient device simulation by matrix exponential method

Kumashiro, Shigetaka, Kamei, Tatsuya, Hiroki, Akira, Kobayashi, Kazutoshi
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Year:
2017
Language:
english
DOI:
10.23919/SISPAD.2017.8085258
File:
PDF, 397 KB
english, 2017
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