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[IEEE 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Kamakura, Japan (2017.9.7-2017.9.9)] 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Analysis of screening effects in multiple-gate and gate-all-around Si NW array FETs
Darbandy, Ghader, Mothes, Sven, SchrOter, Michael, Claus, MartinYear:
2017
Language:
english
DOI:
10.23919/SISPAD.2017.8085294
File:
PDF, 709 KB
english, 2017