[IEEE 2017 International Conference on Simulation of...

  • Main
  • [IEEE 2017 International Conference on...

[IEEE 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Kamakura, Japan (2017.9.7-2017.9.9)] 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - TCAD simulation methodology for full 3-D electro-physical and advanced thermal analysis of power modules

Pribytny, Patrik, Chvala, Ales, Marek, Juraj, Donoval, Daniel
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.23919/sispad.2017.8085311
File:
PDF, 545 KB
english, 2017
Conversion to is in progress
Conversion to is failed