[IEEE ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC) - Leuven, Belgium (2017.9.11-2017.9.14)] 2017 47th European Solid-State Device Research Conference (ESSDERC) - Study of error repeatability and recovery in 40nm TaOx ReRAM
Inose, Takashi, Aritome, Seiichi, Yasuhara, Ryutaro, Mishima, Satoshi, Takeuchi, KenYear:
2017
Language:
english
DOI:
10.1109/ESSDERC.2017.8066579
File:
PDF, 2.71 MB
english, 2017