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[IEEE ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC) - Leuven, Belgium (2017.9.11-2017.9.14)] 2017 47th European Solid-State Device Research Conference (ESSDERC) - Back-gate bias effect on UTBB-FDSOI non-linearity performance
Esfeh, B. Kazemi, Kilchytska, V., Parvais, B., Planes, N., Haond, M., Flandre, D., Raskin, J.-P.Year:
2017
Language:
english
DOI:
10.1109/ESSDERC.2017.8066613
File:
PDF, 2.18 MB
english, 2017