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[IEEE 2017 29th International Conference on Microelectronics (ICM) - Beirut, Lebanon (2017.12.10-2017.12.13)] 2017 29th International Conference on Microelectronics (ICM) - A reduced order model based manifold technique for automated defect judging, Application to structural holes
Ghnatios, Chady, Rustom, Alexios, Asmar, Ghazi, Chakar, ElieYear:
2017
Language:
english
DOI:
10.1109/ICM.2017.8268869
File:
PDF, 232 KB
english, 2017