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[IEEE 2017 International Conference on Trends in Electronics and Informatics (ICOEI) - Tirunelveli, India (2017.5.11-2017.5.12)] 2017 International Conference on Trends in Electronics and Informatics (ICEI) - Cost aware test suite reduction algorithm for regression testing

Indumathi, C. P., Madhumathi, S.
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Year:
2017
Language:
english
DOI:
10.1109/ICOEI.2017.8300829
File:
PDF, 294 KB
english, 2017
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