[IEEE ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC) - Leuven, Belgium (2017.9.11-2017.9.14)] 2017 47th European Solid-State Device Research Conference (ESSDERC) - On the understanding of cathode related trapping effects in GaN-on-Si Schottky diodes
Vandendaele, W., Lorin, T., Gwoziecki, R., Baines, Y., Biscarrat, J., Jaud, M.A., Gillot, C., Charles, M., Plissonnier, M., Reimbold, G.Year:
2017
Language:
english
DOI:
10.1109/essderc.2017.8066608
File:
PDF, 1.56 MB
english, 2017