[IEEE 2017 30th IEEE International System-on-Chip Conference (SOCC) - Munich (2017.9.5-2017.9.8)] 2017 30th IEEE International System-on-Chip Conference (SOCC) - Application of machine learning methods in post-silicon yield improvement
Yigit, Baris, Zhang, Grace Li, Li, Bing, Shi, Yiyu, Schlichtmann, UlfYear:
2017
Language:
english
DOI:
10.1109/socc.2017.8226049
File:
PDF, 396 KB
english, 2017