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Design of stuck-open fault testable CMOS complex gates
Tsiatouhas, Y., Haniotakis, Th., Halatsis, C., Arapoyanni, A.Volume:
32
Year:
1996
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19960247
File:
PDF, 437 KB
english, 1996