Highly repeatable nanoscale phase coexistence in vanadium dioxide films
Huffman, T. J., Lahneman, D. J., Wang, S. L., Slusar, T., Kim, Bong-Jun, Kim, Hyun-Tak, Qazilbash, M. M.Volume:
97
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.97.085146
Date:
February, 2018
File:
PDF, 2.09 MB
english, 2018