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[IEEE 2017 IEEE International Conference on Big Data (Big Data) - Boston, MA (2017.12.11-2017.12.14)] 2017 IEEE International Conference on Big Data (Big Data) - Discovering potential traffic risks in Japan using a supervised learning approach
Kobayashi, Tatsuru, Matsushima, Shin, Lee, Taito, Yamanishi, KenjiYear:
2017
DOI:
10.1109/BigData.2017.8258014
File:
PDF, 1.10 MB
2017