[IEEE 2017 IEEE Electrical Insulation Conference (EIC) - Baltimore, MD, USA (2017.6.11-2017.6.14)] 2017 IEEE Electrical Insulation Conference (EIC) - Pulsed infrared thermography to inspect the internal defects of composite insulators
Liu, Lishuai, Mei, Hongwei, Wang, Liming, Zhao, Chenlong, Guan, ZhichengYear:
2017
Language:
english
DOI:
10.1109/EIC.2017.8004665
File:
PDF, 799 KB
english, 2017