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[IEEE 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Salinas (2017.10.16-2017.10.20)] 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Mammogram classification using back-propagation neural networks and texture feature descriptors

Perez, Maria, Benalcazar, Marco E., Tusa, Eduardo, Rivas, Wilmer, Conci, Aura
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Year:
2017
Language:
english
DOI:
10.1109/ETCM.2017.8247515
File:
PDF, 398 KB
english, 2017
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