[IEEE 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Salinas (2017.10.16-2017.10.20)] 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Mammogram classification using back-propagation neural networks and texture feature descriptors
Perez, Maria, Benalcazar, Marco E., Tusa, Eduardo, Rivas, Wilmer, Conci, AuraYear:
2017
Language:
english
DOI:
10.1109/ETCM.2017.8247515
File:
PDF, 398 KB
english, 2017