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[IEEE 2017 7th International Conference on Integrated Circuits, Design and Verification (ICDV) - Hanoi (2017.10.5-2017.10.6)] 2017 7th International Conference on Integrated Circuits, Design, and Verification (ICDV) - Texture characteristic based fast algorithm for CU size decision in HEVC intra coding
Le Dinh Trang, Dang, Kim, KyungRae, Chang, Ik Joon, Kim, JinsangYear:
2017
DOI:
10.1109/ICDV.2017.8188645
File:
PDF, 622 KB
2017