[IEEE 2017 7th International Conference on Integrated...

  • Main
  • [IEEE 2017 7th International Conference...

[IEEE 2017 7th International Conference on Integrated Circuits, Design and Verification (ICDV) - Hanoi (2017.10.5-2017.10.6)] 2017 7th International Conference on Integrated Circuits, Design, and Verification (ICDV) - Texture characteristic based fast algorithm for CU size decision in HEVC intra coding

Le Dinh Trang, Dang, Kim, KyungRae, Chang, Ik Joon, Kim, Jinsang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
DOI:
10.1109/ICDV.2017.8188645
File:
PDF, 622 KB
2017
Conversion to is in progress
Conversion to is failed