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[IEEE 2017 IEEE International Conference on Image Processing (ICIP) - Beijing, China (2017.9.17-2017.9.20)] 2017 IEEE International Conference on Image Processing (ICIP) - Circle detection by arc-support line segments

Lu, Changsheng, Xia, Siyu, Huang, Wanming, Shao, Ming, Fu, Yun
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Year:
2017
Language:
english
DOI:
10.1109/ICIP.2017.8296246
File:
PDF, 1.05 MB
english, 2017
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