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[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Experiment and analysis of transient ionizing radiation effects in 0.5um bulk CMOS buffer
Li, Tongde, Zhao, Yuanfu, Wang, Liang, Zheng, Hongchao, Chen, Maoxin, Shu, Lei, Liu, JiaqiYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060208
File:
PDF, 663 KB
english, 2017